■DX-1/2/2A TYPE X-RAY ORIENTATION UNIT FOR SINGLE CRYSTAL
■DX-3/4/4A TYPE HIGH-ACCURACY X-RAY ORIENTATION UNIT FOR SINGLE CRYSTAL
■DX-5/6 TYPE HIGH-ACCURACY X-RAY ADHESIVE ORIENTATION UNIT
■DX-5C TYPE ULTRAHIGH PRECISION X-RAY QUARTZ BAR SET UNIT
■DX-5D TYPE HIGH PRECISION SC-CUT X-RAY QUARTZ BAR UNIT
■DX-7 TYPE X-RAY ORIENTATION UNIT FOR BIG CRYSTAL BAR
■DX-7 TYPE  SEMICONDUTOR SEED X-RAY ORIENTATION UNIT
■DX-7A TYPE X-RAY ORIENTATION UNIT FOR SILICON WAFER
■DX-7B TYPE CRYSTAL INGOT X-RAY ORIENTATION UNIT
■DX-7C TYPE SILICON CRYSTAL INGOT X-RAY ORIENTATION UNIT
■DX-7CF TYPE SILICON CRYSTAL INGOT X-RAY RE-MEASORE UNIT
■DX-7CZ TYPE SILICON CRYSTAL INGOT STICK UNIT
■DX-8 TYPE X-RAY ORIENTATION UNIT FOR TUMBLING MILL
■DX-8A TYPE VERTICAL SEMICONDUCTOR OF-PLANE X-RAY ORIENTATION UNIT
■DX-8B TYPE HORIZONTAL SEMICONDUCTOR OF-PLANE X-RAY ORIENTATION UNIT
■DX-9B TYPE X-RAY BACKSWING CURVE MEASURING INSTRUMENT
■DX-9/9A TYPE SEMI-AUTOMATIC X-RAY ORIENTATION UNIT FOR SINGLE CRYSTAL
■DX-9C TYPE X-RAY ORIENTATION UNIT FOR SC CUTTING WAFER
■DXD-1 TYPE ANY DEVIATION ANGLE CRYSTAL X-RAY ORIENTATION DISTINGUISH UNIT

¦ DX-9B TYPE X-RAY BACKSWING CURVE MEASURING INSTRUMENT
¦ Description
The apparatus is used to detect the fault of single-crystal materials, suitable for general requirements of industrial production. It consists of test desk, high viltage generator and computer analysis system. The test desk is mainly composed of copper target X-ray tube (30kV, 1mA), geiger tube and push-in SCM system, equipped with monochromator as well. The real time data acquired by the SCM are transmitted to the computer analysis system to be processed.
The computer analysis system is composed of the computer, data analysis software and printer. It processes the peaky curve which is obtained after analysing and processing real time data, and displays the peak position angle and FWHM by means of form and curve on the computer screen, then outputs the testing results by the printer. Generally it takes 2-3 minutes to test a sample once and the sample can be tested once or many times, repeatability≤±5″.
The apparatus is also a semi-automatic high-accuracy orientation unit, the accuracy of angular measurement of which is ±15″ and least reading is 1″. As crystal plane whose reflecting ability is poor such as SiO2(0003) is concerned, its accuracy of measurement is up to ±15″.
It is equipped with ray window electromagnetic optical gate and reliable radial protective cover, which guarantee the safe handling.
The apparatus can be made into table model (as picture above) or other types, among which:
Overall Dimensions of Worktable: 1500(length)×700(width)×750(height)
Weight of Test Desk: 75kg
Weight of High Voltage Generator: 65kg.